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Publish Date
June 30, 2002
Pages
238
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Nondestructive Evaluation and Reliability of Micro and Nanomaterial Systems (Proceedings of SPIE)
June 30, 2002, SPIE Society of Photo-Optical Instrumentation Engi, SPIE
Paperback
0819444510 9780819444516
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Feedback?December 7, 2020 | Edited by MARC Bot | import existing book |
July 31, 2020 | Created by ImportBot | import existing book |