An edition of Characterization of high Tc materials and devices by electron microscopy (2000)

Characterization of high Tc materials and devices by electron microscopy

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Cover of: Characterization of high Tc materials and devices by electron microscopy by Stephen J. Pennycook
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Last edited by ImportBot
August 23, 2020 | History
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An edition of Characterization of high Tc materials and devices by electron microscopy (2000)

Characterization of high Tc materials and devices by electron microscopy

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Publish Date
Publisher
Cambridge University Press
Language
English
Pages
391

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Previews available in: English

Subjects

Electron microscopy, Technique, High temperature superconductors, TECHNOLOGY & ENGINEERING, Superconductors & Superconductivity, Elektronenmikroskopie, Superconductors, Hochtemperatursupraleiter, Electron microscopes
Edition Availability
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2009, Cambridge University Press
in English
Libraries near you: WorldCat
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2005, Cambridge University Press
in English
Libraries near you: WorldCat
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English
Libraries near you: WorldCat
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English
Libraries near you: WorldCat
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English
Libraries near you: WorldCat
Cover of: Characterization of high Tc materials and devices by electron microscopy
Characterization of high Tc materials and devices by electron microscopy
2000, Cambridge University Press
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references.

Published in
Cambridge, UK, New York

Classifications

Dewey Decimal Class
537.6/23/0284
Library of Congress
QC611.98.H54 C43 1999, QC611.98.H54 C43 2000, QC611.98.H54 C43 200

The Physical Object

Pagination
xii, 391 p. :
Number of pages
391

ID Numbers

Open Library
OL22220562M
Internet Archive
characterization00brow
ISBN 10
052155490X
LCCN
99018754
OCLC/WorldCat
40776918
Goodreads
1448028

Source records

University of Toronto MARC record
Internet Archive item record
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Library of Congress MARC record
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Promise Item
marc_columbia MARC record

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History

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August 23, 2020 Edited by ImportBot import existing book
June 29, 2019 Edited by MARC Bot import existing book
June 29, 2019 Edited by MARC Bot import existing book
March 12, 2019 Created by MARC Bot import existing book