Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Dev ...
Stephen J. Pennycook, Nigel D. ...
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Last edited by ImportBot
November 19, 2022 | History

Characterization of High Tc Materials and Devices by Electron Microscopy

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Publish Date
Language
English

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Previews available in: English

Edition Availability
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2009, Cambridge University Press
in English
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2005, Cambridge University Press
in English
Cover of: Characterization of high Tc materials and devices by electron microscopy
Characterization of high Tc materials and devices by electron microscopy
2000, Cambridge University Press
in English
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English
Cover of: Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
2000, Cambridge University Press
in English

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Book Details


ID Numbers

Open Library
OL40479984M
ISBN 13
9780511038150

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Better World Books record

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November 19, 2022 Created by ImportBot Imported from Better World Books record