An edition of ESD (2005)

ESD

Failure Mechanisms and Models

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ESD
Steven H. Voldman, Steven H. V ...
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Last edited by ImportBot
September 17, 2021 | History
An edition of ESD (2005)

ESD

Failure Mechanisms and Models

  • 3 Want to read
  • 1 Currently reading

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD. With an emphasis on examples, this text: explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods; outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology; focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well a...

Publish Date
Language
English
Pages
408

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Previews available in: English

Edition Availability
Cover of: ESD
ESD: Failure Mechanisms and Models
2009, Wiley & Sons, Limited, John
in English
Cover of: ESD
ESD
2006, John Wiley & Sons, Ltd.
Electronic resource in English
Cover of: ESD
ESD: circuits and devices
2006, John Wiley, Wiley
in English

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Book Details


The Physical Object

Number of pages
408
Weight
0.824

ID Numbers

Open Library
OL33398457M
ISBN 13
9780470747254

Source records

Better World Books record

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September 17, 2021 Created by ImportBot Imported from Better World Books record