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Last edited by ImportBot
May 4, 2020 | History
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Zhenghao Gan

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  • Cover of: Semiconductor Process Reliability in Practice

    First published in 2012 — 1 edition
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  • Cover of: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

    First published in 2013 — 1 edition
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Subjects

Finite element method, Integrated circuits, ultra large scale integration, Reliability, Reliability (engineering), Semiconductors

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ID Numbers

  • OLID: OL7865368A

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History

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May 4, 2020 Created by ImportBot import new book