An edition of Characterization of high Tc materials and devices by electron microscopy
(2006)
Characterization of High Tc Materials and Devices by Electron Microscopy
New Ed edition
by Stephen J. Pennycook
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| Edition | Availability |
|---|---|
1
Characterization of High Tc Materials and Devices by Electron Microscopy
November 23, 2006, Cambridge University Press
Paperback
in English
- New Ed edition
0521031702 9780521031707
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2
Characterization of high Tc materials and devices by electron microscopy
2006, Cambridge University Press
in English
- Digitally printed 1st pbk. version.
0521031702 9780521031707
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Book Details
First Sentence
"High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale."
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| October 4, 2021 | Edited by ImportBot | import existing book |
| February 11, 2019 | Created by MARC Bot | import existing book |