Record ID | ia:trent_0116400836510_12 |
Source | Internet Archive |
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001 ocn890998711
003 OCoLC
005 20191227092359.0
008 140921s1991 enkac o 001 0 eng d
006 m o d
007 cr cnu---unuuu
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019 $a893740453$a907032837
020 $a9781483288000$q(electronic bk.)
020 $a1483288005$q(electronic bk.)
020 $z9780120299126
020 $z0120299127
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245 00 $aAdvances in optical and electron microscopy.$nVolume 12 /$cedited by T. Mulvey and C.J.R. Sheppard.
264 1 $aLondon :$bAcademic Press,$c1991.
300 $a1 online resource (xii, 363 pages)
336 $atext$btxt$2rdacontent
337 $acomputer$bc$2rdamedia
338 $aonline resource$bcr$2rdacarrier
500 $aIncludes index.
588 0 $aOnline resource; title from PDF title page (ScienceDirect, viewed Sep. 21, 2014).
505 0 $aFront Cover; Advances in Optical and Electron Microscopy; Copyright Page ; Contributors; Preface; Table of Contents; Chapter 1. The Invention of the Electron Fresnel Interference Biprism; I. Childhood years in Bielefeld; II. Gaining technical know-how as a student apprentice; III. A broad education in physics with Professor Walter Kossel; IV. Influence of the work of kikuchi and convergent beam diffraction; V. Electron-optical experiments with Brüche, Scherzer and Mahl; VI. Quantitative testing of the operation of the biprism; VII. Measurement of the inner potential of solids.
505 8 $aVIII. Electron interference microscope in the transmission modeIX. The intensity problem in electron interferometers; X. Atomic resolution electron holography; Chapter 2. Electron Image Plane Off-axis Holography of Atomic Structures; I. Introduction; II. Principles of off-axis image plane electron holography; III. Performance of image plane electron holography; IV. Influence of the lens aberrations in the high-resolution domain; V. Reconstruction of the image wave and correction of aberrations; VI. Experimental realization of holography of atomic structures; VII. Conclusion; References.
505 8 $aChapter 3. Magnetic Through-the-lens Detection in Electron Microscopy and Spectroscopy, Part 1I. Introduction; II. Historical development of through-the-lens detection; III. Historical development of the magnetic parallelizer for spectroscopy applications; IV. Theory of adiabatic motion; V. Summary; References; Chapter 4. Advances in Voltage-Contrast Detectors in Scanning Electron Microscopes; I. Introduction; II. Test techniques for integrated circuits; III. Secondary electrons; IV. Voltage-contrast detectors; V. Design of a double channel spectrometer; VI. Measurements.
505 8 $aVII. Future developmentsVIII. Conclusions; IX. List of symbols; Acknowledgements; References; Chapter 5. Scanning Near-field Optical Microscopy (SNOM); I. Introduction; II. Historical background; III. Theoretical background; IV. Experimental work; V. DISCUSSION; Acknowledgements; References; Chapter 6. Microscopic Thermal Wave Non-destructive Testing; I. Introduction; II. Thermal waves and their generation; III. The resolution of the thermal wave microscope; IV. Photothermal NDE techniques with periodic heating; V. Photothermal pulse and scanning methods; VI. Experimental pulse techniques.
505 8 $aVII. ConclusionReferences; INDEX.
520 $aThe volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and industrial inspection.
650 0 $aMicroscopy.
650 0 $aMicroscopes.
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650 7 $aMicroscopy.$2fast$0(OCoLC)fst01020062
650 7 $aMicroscopia eletrônica.$2larpcal
650 7 $aMicroscopie.$2ram
655 4 $aElectronic books.
700 1 $aMulvey, T.,$eeditor,
700 1 $aSheppard, Colin,$eeditor.
776 08 $iPrint version:$tAdvances in optical and electron microscopy. Volume 12$z0120299127$z9780120299126$w(OCoLC)22627054
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