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Last edited by ImportBot
October 26, 2008 | History
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Cher Ming Tan

We need a photo of Cher Ming Tan

Born 1959

6 works Add another?

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  • Cover of: Applications of finite element methods for reliability studies on ULSI interconnections

    First published in 2011 — 1 edition
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  • Cover of: Microelectronic yield, reliability, and advanced packaging: 28-30 November 2000, Singapore

    First published in 2000 — 1 edition
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  • Cover of: Electromigration Modeling at Circuit Layout Level

    First published in 2013 — 1 edition
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  • Cover of: Band structure and electrical transport in n-i-n-i doping superlattices.

    First published in 1992 — 1 edition
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  • Cover of: Sample preparation for electrical characterizatin of MBE grown ZnSe film on Ge substrate.

    First published in 1988 — 1 edition
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  • Cover of: Electromigration in ULSI Interconnections

    First published in 2010 — 1 edition
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We need a photo of Cher Ming Tan

Born 1959

Subjects

Integrated circuits, Diffusion, Integrated circuits, ultra large scale integration, Ultra large scale integration, Chemical engineering, Congresses, Electrodiffusion, Finite element method, Microelectromechanical systems, Microelectronic packaging, Reliability, Reliability (Engineering), Reliability (engineering)

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ID Numbers

  • OLID: OL5949998A

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History

Download catalog record: RDF / JSON
October 26, 2008 Created by ImportBot Imported from University of Toronto MARC record